Session 6: Industrial Applications

Keynote lecture
"Applying X-rays in Material Analysis"
We will describe the application of X-ray diffraction to different areas of materials analysis. The spectrum of samples in XRD covers amorphous, polycrystalline and perfect mono-crystalline materials. For polycrystalline materials we can determine the properties like phase composition, crystallographic unit cell, atomic structure, preferred orientation (texture), residual stress and particle size distribution. For thin films and layers XRD delivers information about thickness, roughness, density, curvature and phase composition. The analysis of properties of materials integrated into device creates another interesting group of applications like failure analysis and production control. This presentation will briefly outline the modern concepts of X-Ray diffractometers and the challenges that appeared for X-Ray detectors. Finally, we will show examples from the different fields.
dr. Vladimir Kogan Senior Research Scientist Philips Analytical TEL: 0546 53 42 13 FAX: 0546 53 45 93 Email: Vladimir.Kogan@philips.com
Vladimir Kogan obtained his PhD in solid state physics at Rostov State University, Russia. During the past 8 years he is working on predevelopment projects at Philips Analytical in Almelo, The Netherlands. The main target of his work is the development of new systems for scientific and industrial applications of X-ray diffraction. Besides to this, he is also involved in DANNALAB, a contract research company based at the MESA+ Research Institute in Enschede, The Netherlands. He is the author of about 30 publications in his field and holds one US patent, while several others are pending. His research interests are: mathematical methods in powder diffraction, X-ray optics and non-trivial XRD applications.