| Opening session |
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"Semiconductor Detectors in the Low Countries" |
Erik Heijne (CERN, Switzerland) |
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"A Personal Perspective on the Evolution of Radiation Detectors" |
Glenn F. Knoll (University of Michigan, U.S.A.) |
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| Session 1: Detector materials |
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"Inorganic scintillators in medical imaging detectors" |
Carel van Eijk (IRI, Delft, The Netherlands) |
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"Advances in Germanium Detector Technology For Imaging" |
Pat Sangsingkeow (ORTEC, U.S.A.) |
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| Session 2: Processing, Characterization, Reliability, Radiation Damage, Simulation |
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"Advances in semiconductor detectors for particle tracking in extreme radiation environments" |
Cinzia Da Via' (Brunel University, UK) |
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| Session 3: Frontend Electronics |
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"Trends and Perspectives in deepsubmicron circuit design" |
Bram Nauta (Univ. of Twente, The Netherlands) |
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"Monolithic CMOS Pixel Detectors for Radiation Imaging" |
Wojciech Dulinski (LEPSI, France) |
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| Session 4: High Density Interconnect Technology |
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"Multilayer thin film technology, solving high-density interconnect and assembly problems" |
Eric Beyne (IMEC, Belgium) |
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| Session 5: Applications in Life Sciences |
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"Nuclear Imaging in the Realm of Medical Imaging" |
Frank Deconinck (VU Brussels, Belgium) |
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"The clinical value of X-ray images of the teeth and jaws" |
Laetitia Brocklebank (Glasgow Dental Hospital & School, UK) |
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"Intra-oral and extra-oral digital imaging: an overview of factors relevant to detector design" |
Gerard C.H. Sanderink (ACTA, The Netherlands) |
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Title to be confirmed |
prof. Dr. J.P. Abrahams (Leiden Institute of Chemistry, The Netherlands) |
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"Flat X-ray Detectors for Medical Imaging" |
Dr. Michael Overdick (Philips Research Aachen, Germany) |
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| Session 6: Industrial Applications |
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"Applying X-rays in Material Analysis" |
Dr. Vladimir Kogan (Philips Analytical Almelo, The Netherlands) |
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| Session 7: Other Applications |
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"X-ray imaging spectrometers in present and future satellite missions" |
Dr. Peter Lechner (MPI Halbleiterlabor, Munchen, Germany) |
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| Closing session |
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Workshop summary talk |
Mario Caria (Université d'Auvergne, Clermont-Ferrand, France) |
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Concluding remarks |
Jan Visschers (NIKHEF Amsterdam, The Netherlands) |
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